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Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109
Figure 1: Preparation and post-processing of the samples investigated in this work. Throughout the text the s...
Figure 2: SEM images of the samples. The 500 × 860 nm2 insets show the morphology of the post-processed Co/Pt...
Figure 3: Time-dependent conductance of the Pt layer of sample C normalized to its saturation value after the...
Figure 4: Hall voltage cycling at 10 K for all samples. Before measurements, all samples were saturated at 3 ...
Figure 5: TEM micrographs of sample C acquired (a) in the high angle annular dark field mode and (b) in the a...
Figure 6: (a) Cross-sectional and (b) lower layer in-plane EDX elemental peak intensities for sample C acquir...
Figure 7: The location of the probed layers is shown in panel (a). Nano-diffractograms of the upper (b) and t...
Figure 8: Isothermal Hall voltage cycling for sample D at a series of temperatures, as indicated. Insets: Tem...
Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70
Figure 1: Illustration of FEBID. Precursor molecules (here: organometallic complex; blue: metal, green: organ...
Figure 2: Single-species growth rate calculated for the precursor Me3Pt(IV)CpMe assuming three different elec...
Figure 3: Molecular models of octanol (left) and Co2(CO)8 (right). Rendered using Jmol.
Figure 4: Simulation of concentration of different elements in FEBID structure under parallel use of Co2(CO)8...
Figure 5: Molecular models of Si5H12 (left) and Me3Pt(IV)CpMe (right). Rendered using Jmol.
Figure 6: Elemental composition of various Pt–Si deposits as determined by EDX according to [28]. The data were t...
Figure 7: Dependence of the room temperature resistivity on the Si/Pt ratio in the FEBID samples according to ...
Figure 8: Temperature-dependent conductivity of the Pt–Si FEBID samples represented as ln σ vs T−a to facilit...
Figure 9: TEM electron diffraction pattern of samples on carbon membrane before (left) and after (right) post...
Figure 10: Temperature-dependent conductivity and Hall effect as a function of the applied magnetic field for ...
Figure 11: Dependence of the yield ratio for the precursors Co2(CO)8 and Me3Pt(IV)CpMe on the dwell time withi...
Figure 12: Phase diagram of the transport regimes of granular metals. In the insulating regime for g < gc ther...
Figure 13: Temperature-dependent conductivity of Pt–C FEBID structures that have been exposed to different pos...
Figure 14: Temperature-dependent conductivity of Pt–C FEBID structures that have been exposed to different pos...
Figure 15: Calculated gauge factor κ as a function of intergrain coupling strength (bottom axis) and metal vol...
Figure 16: Left: Strain-resistance effect of a Pt–C nanogranular sensor element measured on a test cantilever ...
Beilstein J. Nanotechnol. 2012, 3, 546–555, doi:10.3762/bjnano.3.63
Figure 1: (a) Optical micrograph of the Co dissociation product on the plasma-activated silica surface. The d...
Figure 2: SEM images of Co deposited on the plasma-pretreated silicon oxide and gold. The picture on the top ...
Figure 3: (a) SEM micrograph of Co deposit formed after electron pre-irradiation of the rectangular area depi...
Figure 4: (a) Temperature dependence of resistivity of Co deposit grown on the plasma-activated SiO2 surfaces...
Figure 5: (a) Top and (b) side view of DFT optimized structure of Co2(CO)8 and its frontier orbitals (c) HOMO...
Figure 6: Schematic representation of the starting configurations with possible Co2(CO)8 orientations, consid...
Figure 7: (a) Most stable structure of Co2(CO)8 on the (a) FOH-SiO2 and (b) POH-SiO2 surfaces. The molecule d...
Figure 8: Band decomposed charge density for the valence band maximum for Co2(CO)8 on the (a) FOH-SiO2 and (b...